Imaging of Electric Fields at the GaN/Ni Interface Using...

Microscopy and Microanalysis 2017 / 07 Vol. 23; Iss. S1

Imaging of Electric Fields at the GaN/Ni Interface Using Electron Beam Induced Current in a Scanning Transmission Electron Microscope

Warecki, Zoey, Oleshko, Vladimir, Armstrong, Andrew, Collins, Kimberly, Talin, A. Alec, Cumings, John
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Volume:
23
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927617007814
Date:
July, 2017
File:
PDF, 452 KB
english, 2017
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