Picometer-Precision Strain Mapping of Two-Dimensional...

Microscopy and Microanalysis 2017 / 07 Vol. 23; Iss. S1

Picometer-Precision Strain Mapping of Two-Dimensional Heterostructures using an Electron Microscope Pixel Array Detector (EMPAD)

Han, Yimo, Xie, Saien, Nguyen, Kayla, Cao, Michael, Tate, Mark W., Purohit, Prafull, Gruner, Sol M., Park, Jiwoong, Muller, David A.
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Volume:
23
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927617009229
Date:
July, 2017
File:
PDF, 2.05 MB
english, 2017
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