RISE - Raman SEM Imaging of Single Layer and Twisted Bilayer Graphene
Schmidt, Ute, Zimmermann, Hans, Freitag, Stefanie, Dieing, ThomasVolume:
23
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927617009400
Date:
July, 2017
File:
PDF, 1.73 MB
english, 2017