From High-precision Imaging to High-performance Computing:...

Microscopy and Microanalysis 2017 / 07 Vol. 23; Iss. S1

From High-precision Imaging to High-performance Computing: Leveraging ADF-STEM Atom-counting and DFT for Catalyst Nano-metrology

Jones, Lewys, Skylaris, Chris-Kriton, Nellist, Peter D., Varambhia, Aakash, Aarons, Jolyon, MacArthur, Katherine E., Ozkaya, Dogan, Sarwar, Misbah
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Volume:
23
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927617010066
Date:
July, 2017
File:
PDF, 409 KB
english, 2017
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