Isovalent doping and the CiOi defect in germanium
Christopoulos, S.-R. G., Sgourou, E. N., Vovk, R. V., Chroneos, A., Londos, C. A.Language:
english
Journal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-017-8372-6
Date:
December, 2017
File:
PDF, 1.27 MB
english, 2017