Study on Trapping Effects in AlGaN/GaN-on-Si Devices with...

ECS Journal of Solid State Science and Technology 2017 Vol. 6; Iss. 11

Study on Trapping Effects in AlGaN/GaN-on-Si Devices with Vertical Interconnect Structures

Chang, Ting-Fu, Chang, Chih-Yao, Huang, Chih-Fang, Liang, Yung C., Samudra, Ganesh S., Lin, Ray-Ming
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Volume:
6
Year:
2017
Language:
english
Journal:
ECS Journal of Solid State Science and Technology
DOI:
10.1149/2.0131711jss
File:
PDF, 590 KB
english, 2017
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