[IEEE 2017 IEEE International Symposium on Circuits and...

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[IEEE 2017 IEEE International Symposium on Circuits and Systems (ISCAS) - Baltimore, MD, USA (2017.5.28-2017.5.31)] 2017 IEEE International Symposium on Circuits and Systems (ISCAS) - Impacts of different shapes of through-silicon-via core on 3D IC performance

Yousuf, Abdul Hamid Bin, Hossain, Nahid M., Chowdhury, Masud H.
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Year:
2017
Language:
english
DOI:
10.1109/ISCAS.2017.8050434
File:
PDF, 322 KB
english, 2017
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