Investigation of Cycling Induced Dummy Cell Disturbance in...

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IEEE Electron Device Letters 2017

Investigation of Cycling Induced Dummy Cell Disturbance in 3D NAND Flash Memory

Zou, Xingqi, Jin, Lei, Jiang, Dandan, Zhang, Yu, Chen, Guoxing, Huo, Zongliang
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Year:
2017
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2017.2785843
File:
PDF, 492 KB
english, 2017
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