A scanning tunneling microscopy based potentiometry...

AIP Advances 2017 / 12 Vol. 7; Iss. 12

A scanning tunneling microscopy based potentiometry technique and its application to the local sensing of the spin Hall effect

Xie, Ting, Dreyer, Michael, Bowen, David, Hinkel, Dan, Butera, R. E., Krafft, Charles, Mayergoyz, Isaak
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Volume:
7
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.4991916
Date:
December, 2017
File:
PDF, 2.22 MB
english, 2017
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