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Development and Molecular Characterization of Wheat- Aegilops peregrina Introgression Lines with Resistance to Leaf Rust and Stripe Rust
Narang, Deepika, Kaur, Satinder, Saini, Jyoti, Chhuneja, ParveenVolume:
32
Language:
english
Journal:
Journal of Crop Improvement
DOI:
10.1080/15427528.2017.1398117
Date:
January, 2018
File:
PDF, 1.29 MB
english, 2018