![](/img/cover-not-exists.png)
[IEEE IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society - Beijing, China (2017.10.29-2017.11.1)] IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society - Active thermal control for reliability improvement of MOS-gated power devices
Soldati, Alessandro, Concari, Carlo, Dossena, Fabrizio, Barater, Davide, Iannuzzo, Francesco, Blaabjerg, FredeYear:
2017
Language:
english
DOI:
10.1109/IECON.2017.8217391
File:
PDF, 445 KB
english, 2017