[IEEE 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD) - Strasbourg, France (2016.10.29-2016.11.6)] 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD) - Statistical feature selection and classification models for Alzheimer's disease progression assessment
Dominguez, A., Ramirez, J., Gorriz, J. M., Segovia, F., Salas-Gonzalez, D., Martinez-Murcia, F. J., Illan, I. A.Year:
2016
Language:
english
DOI:
10.1109/NSSMIC.2016.8069560
File:
PDF, 625 KB
english, 2016