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[ACM Press the 1st Workshop - Chicago, IL, USA (2017.05.14-2017.05.19)] Proceedings of the 1st Workshop on Data Management for End-to-End Machine Learning - DEEM'17 - Towards Automatically Setting Language Bias in Relational Learning
Picado, Jose, Termehchy, Arash, Fern, Alan, Pathak, SudhanshuYear:
2017
Language:
english
DOI:
10.1145/3076246.3076249
File:
PDF, 495 KB
english, 2017