Electrical Characterization of Vertically Stacked p-FET SOI...

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Solid-State Electronics 2017 / 12

Electrical Characterization of Vertically Stacked p-FET SOI Nanowires

Cardoso Paz, Bruna, Cassé, Mikaël, Barraud, Sylvain, Reimbold, Gilles, Vinet, Maud, Faynot, Olivier, Antonio Pavanello, Marcelo
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Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2017.12.011
Date:
December, 2017
File:
PDF, 1.09 MB
english, 2017
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