Investigation of ramped voltage stress to screen defective magnetic tunnel junctions
Choi, Chulmin, Sukegawa, Hiroaki, Mitani, Seiji, Song, YunheubVolume:
33
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/1361-6641/aa99bb
Date:
January, 2018
File:
PDF, 1.99 MB
english, 2018