[IEEE 2017 2nd International Conference for Convergence in Technology (I2CT) - Mumbai, India (2017.4.7-2017.4.9)] 2017 2nd International Conference for Convergence in Technology (I2CT) - Intrusion detection using data mining with correlation
Singh, Varsha, Puthran, Shubha, Tiwari, AvanishYear:
2017
Language:
english
DOI:
10.1109/I2CT.2017.8226204
File:
PDF, 534 KB
english, 2017