[IEEE 2017 IEEE/ACM 4th International Workshop on Software Engineering Research and Industrial Practice (SER&IP) - Buenos Aires, Argentina (2017.5.21-2017.5.21)] 2017 IEEE/ACM 4th International Workshop on Software Engineering Research and Industrial Practice (SER&IP) - Identifying and Documenting False Positive Patterns Generated by Static Code Analysis Tools
Reynolds, Zachary P., Jayanth, Abhinandan B., Koc, Ugur, Porter, Adam A., Raje, Rajeev R., Hill, James H.Year:
2017
Language:
english
DOI:
10.1109/SER-IP.2017..20
File:
PDF, 273 KB
english, 2017