SCARe: An SRAM-Based Countermeasure Against IC Recycling
Guo, Zimu, Xu, Xiaolin, Rahman, Md. Tauhidur, Tehranipoor, Mark M., Forte, DomenicYear:
2017
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2017.2777262
File:
PDF, 3.41 MB
english, 2017