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Fractal analysis as a potential tool for surface morphology of thin films
Soumya, S., Swapna, M. S., Raj, Vimal, Mahadevan Pillai, V. P., Sankararaman, S.Volume:
132
Language:
english
Journal:
The European Physical Journal Plus
DOI:
10.1140/epjp/i2017-11826-8
Date:
December, 2017
File:
PDF, 964 KB
english, 2017