Investigation on the origin of exchange bias in epitaxial,...

AIP Advances 2015 / 11 Vol. 5; Iss. 11

Investigation on the origin of exchange bias in epitaxial, oriented and polycrystalline Fe 3 O 4 thin films

Bhat, Shwetha G., Anil Kumar, P. S.
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Volume:
5
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.4935787
Date:
November, 2015
File:
PDF, 6.15 MB
english, 2015
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