Next Generation Technology-Enhanced Assessment (Global Perspectives on Occupational and Workplace Testing) || Technology-Driven Developments in Psychometrics
Scott, John C., Bartram, Dave, Reynolds, Douglas H.Volume:
10.1017/97
Year:
2017
Language:
english
DOI:
10.1017/9781316407547.011
File:
PDF, 311 KB
english, 2017