Next Generation Technology-Enhanced Assessment (Global Perspectives on Occupational and Workplace Testing) || Recurring Themes in the Application of Technology-Enhanced Assessment
Scott, John C., Bartram, Dave, Reynolds, Douglas H.Volume:
10.1017/97
Year:
2017
Language:
english
DOI:
10.1017/9781316407547.016
File:
PDF, 137 KB
english, 2017