Lateral sensitivity in electron probe microanalysis studied...

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Lateral sensitivity in electron probe microanalysis studied by Monte Carlo simulations involving fluorescence enhancements

PETACCIA, M., CASTELLANO, G.
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Language:
english
Journal:
Journal of Microscopy
DOI:
10.1111/jmi.12666
Date:
November, 2017
File:
PDF, 356 KB
english, 2017
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