![](/img/cover-not-exists.png)
Spectrum imaging of complex nanostructures using DualEELS: II. Absolute quantification using standards
Craven, Alan J., Sala, Bianca, Bobynko, Joanna, MacLaren, IanVolume:
186
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2017.12.011
Date:
March, 2018
File:
PDF, 3.82 MB
english, 2018