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Density of bunched threading dislocations in epitaxial GaN layers as determined using X-ray diffraction
Barchuk, M., Holý, V., Rafaja, D.Volume:
123
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.5009521
Date:
April, 2018
File:
PDF, 1.59 MB
english, 2018