Nanoscale Strain and Composition Mapping in Ionic Thin Film...

Microscopy and Microanalysis 2016 / 07 Vol. 22; Iss. S3

Nanoscale Strain and Composition Mapping in Ionic Thin Film Heterostructures for Resistive Switching Devices

Bowman, William J., Schweiger, Sebastian, Darbal, Amith, Crozier, Peter, Rupp, Jennifer L.M.
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Volume:
22
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927616003445
Date:
July, 2016
File:
PDF, 1.78 MB
english, 2016
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