Electrically reversible cracks in an intermetallic film controlled by an electric field
Liu, Z. Q., Liu, J. H., Biegalski, M. D., Hu, J.-M., Shang, S. L., Ji, Y., Wang, J. M., Hsu, S. L., Wong, A. T., Cordill, M. J., Gludovatz, B., Marker, C., Yan, H., Feng, Z. X., You, L., Lin, M. W., WVolume:
9
Language:
english
Journal:
Nature Communications
DOI:
10.1038/s41467-017-02454-8
Date:
December, 2018
File:
PDF, 1.47 MB
english, 2018