Investigation of the internal chemical composition of chitosan-based LbL films by depth-profiling X-ray photoelectron spectroscopy (XPS) analysis
Bezerra Taketa, Thiago, Martins dos Santos, Danilo, Fiamingo, Anderson, Miguel Vaz, Juliana, Beppu, Marisa Masumi, Campana-Filho, Sérgio Paulo, Cohen, Robert E., Rubner, Michael F.Language:
english
Journal:
Langmuir
DOI:
10.1021/acs.langmuir.7b04104
Date:
January, 2018
File:
PDF, 1.50 MB
english, 2018