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A 14-nm 0.14-ps rms Fractional-N Digital PLL With a 0.2-ps Resolution ADC-Assisted Coarse/Fine-Conversion Chopping TDC and TDC Nonlinearity Calibration
Yao, Chih-Wei, Ni, Ronghua, Lau, Chung, Wu, Wanghua, Godbole, Kunal, Zuo, Yongrong, Ko, Sangsoo, Kim, Nam-Seog, Han, Sangwook, Jo, Ikkyun, Lee, Joonhee, Han, Juyoung, Kwon, Daehyeon, Kim, Chulho, Kim,Volume:
52
Language:
english
Journal:
IEEE Journal of Solid-State Circuits
DOI:
10.1109/JSSC.2017.2742518
Date:
December, 2017
File:
PDF, 7.36 MB
english, 2017