A 0.18-μm CMOS Image Sensor With Phase-Delay-Counting and...

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IEEE Journal of Solid-State Circuits 2017

A 0.18-μm CMOS Image Sensor With Phase-Delay-Counting and Oversampling Dual-Slope Integrating Column ADCs Achieving 1e-rms Noise at 3.8-μs Conversion Time

Le-Thai, Ha, Chapinal, Genis, Geurts, Tomas, Gielen, Georges G. E.
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Year:
2017
Language:
english
Journal:
IEEE Journal of Solid-State Circuits
DOI:
10.1109/JSSC.2017.2751610
File:
PDF, 3.30 MB
english, 2017
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