Analysis of scattering loss due to sidewall roughness in slot waveguides by variation of mode effective index
Wang, Yu, Kong, Mei, Xu, Yameng, Zhou, ZhimingVolume:
20
Language:
english
Journal:
Journal of Optics
DOI:
10.1088/2040-8986/aa9f8f
Date:
February, 2018
File:
PDF, 1.77 MB
english, 2018