Analysis of scattering loss due to sidewall roughness in...

Analysis of scattering loss due to sidewall roughness in slot waveguides by variation of mode effective index

Wang, Yu, Kong, Mei, Xu, Yameng, Zhou, Zhiming
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Volume:
20
Language:
english
Journal:
Journal of Optics
DOI:
10.1088/2040-8986/aa9f8f
Date:
February, 2018
File:
PDF, 1.77 MB
english, 2018
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