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[IEEE 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Thessaloniki, Greece (2017.7.3-2017.7.5)] 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Probabilistic error detection and correction in switched capacitor circuits using checksum codes
Momtaz, Md Imran, Banerjee, Suvadeep, Chatterjee, AbhijitYear:
2017
Language:
english
DOI:
10.1109/IOLTS.2017.8046233
File:
PDF, 472 KB
english, 2017