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BTI Analysis Tool-Modeling of NBTI DC, AC Stress and Recovery Time Kinetics, Nitrogen Impact, and EOL Estimation
Parihar, Narendra, Goel, Nilesh, Mukhopadhyay, Subhadeep, Mahapatra, SouvikYear:
2017
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2017.2780083
File:
PDF, 4.13 MB
english, 2017