Controversial issues in negative bias temperature instability
Stathis, James H., Mahapatra, Souvik, Grasser, TiborVolume:
81
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.12.035
Date:
February, 2018
File:
PDF, 460 KB
english, 2018