Lifetime of electret microphones by thermal degradation analysis via electroacoustic measurements
Nogueira, E., Gil, Juan Sancho, Bote, José Luis SánchezVolume:
81
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.12.018
Date:
February, 2018
File:
PDF, 876 KB
english, 2018