![](/img/cover-not-exists.png)
Structural and optical properties of silica single-layer films doped with ZnS quantum dots: Photoluminescence monitoring of annealing-induced defects
Belache, Boukhalfa, Khelfaoui, Youcef, Bououdina, Mohamed, Souier, Tewfik, Cai, WeipingVolume:
76
Language:
english
Journal:
Materials Science in Semiconductor Processing
DOI:
10.1016/j.mssp.2017.12.013
Date:
March, 2018
File:
PDF, 1.35 MB
english, 2018