Measurement considerations for evaluating BTI effects in SiC MOSFETs
Habersat, Daniel B., Lelis, Aivars J., Green, RonaldVolume:
81
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.12.015
Date:
February, 2018
File:
PDF, 949 KB
english, 2018