Recovery behaviors in n-channel LTPS-TFTs under DC stress
Yan, Wei, Yu, Zhinong, Guo, Jian, Shi, Dawei, Xue, Jianshe, Xue, WeiVolume:
81
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.12.026
Date:
February, 2018
File:
PDF, 947 KB
english, 2018