Recovery behaviors in n-channel LTPS-TFTs under DC stress

Recovery behaviors in n-channel LTPS-TFTs under DC stress

Yan, Wei, Yu, Zhinong, Guo, Jian, Shi, Dawei, Xue, Jianshe, Xue, Wei
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Volume:
81
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.12.026
Date:
February, 2018
File:
PDF, 947 KB
english, 2018
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