[IEEE 2017 IEEE Second Ecuador Technical Chapters Meeting (ETCM) - Salinas, Ecuador (2017.10.16-2017.10.20)] 2017 IEEE Second Ecuador Technical Chapters Meeting (ETCM) - Accuracy of connected confidence left ventricle segmentation in 3-D multi-slice computerized tomography images
Medina, Ruben, Bautista, Sebastian, Morocho, VillieYear:
2017
Language:
english
DOI:
10.1109/ETCM.2017.8247499
File:
PDF, 1.16 MB
english, 2017