PBTI in GaN-HEMTs With p-Type Gate: Role of the Aluminum...

PBTI in GaN-HEMTs With p-Type Gate: Role of the Aluminum Content on $\Delta V_{\mathrm {TH}}$ and Underlying Degradation Mechanisms

Tallarico, Andrea Natale, Stoffels, Steve, Posthuma, Niels, Magnone, Paolo, Marcon, Denis, Decoutere, Stefaan, Sangiorgi, Enrico, Fiegna, Claudio
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
65
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2017.2769167
Date:
January, 2018
File:
PDF, 1.57 MB
english, 2018
Conversion to is in progress
Conversion to is failed