An FPGA-Based Test System for RRAM Technology...

IEEE Transactions on Nanotechnology 2018 / 1 Vol. 17; Iss. 1

An FPGA-Based Test System for RRAM Technology Characterization

Biscontini, Armando, Thammasack, Maxime, De Micheli, Giovanni, Gaillardon, Pierre-Emmanuel
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Volume:
17
Language:
english
Journal:
IEEE Transactions on Nanotechnology
DOI:
10.1109/tnano.2017.2784363
Date:
January, 2018
File:
PDF, 1.04 MB
english, 2018
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