Raman and spectroscopic ellipsometry studies of a-Si:H thin films on low-cost photo paper substrate
Madaka, Ramakrishna, Kanneboina, Venkanna, Agarwal, PratimaVolume:
4
Year:
2017
Language:
english
Journal:
Materials Today: Proceedings
DOI:
10.1016/j.matpr.2017.10.080
File:
PDF, 2.01 MB
english, 2017