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Reliable techniques for integrated circuit identification and true random number generation using 1.5-transistor flash memory
Clark, Lawrence T., Adams, James, Holbert, Keith E.Language:
english
Journal:
Integration, the VLSI Journal
DOI:
10.1016/j.vlsi.2017.10.001
Date:
November, 2017
File:
PDF, 1.51 MB
english, 2017