Time-zero-variability and BTI impact on advanced FinFET...

Microelectronics Reliability 2018 / 02 Vol. 81

Time-zero-variability and BTI impact on advanced FinFET device and circuit reliability

Mukhopadhyay, Subhadeep, Lee, Yung-Huei, Lee, Jen-Hao
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
81
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.12.044
Date:
February, 2018
File:
PDF, 2.42 MB
english, 2018
Conversion to is in progress
Conversion to is failed