Simultaneous measurement of temperature, stress, and...

Review of Scientific Instruments 2017 / 11 Vol. 88; Iss. 11

Simultaneous measurement of temperature, stress, and electric field in GaN HEMTs with micro-Raman spectroscopy

Bagnall, Kevin R., Moore, Elizabeth A., Badescu, Stefan C., Zhang, Lenan, Wang, Evelyn N.
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Volume:
88
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.5010225
Date:
November, 2017
File:
PDF, 4.03 MB
english, 2017
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