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Direct Observation of Redox Switching in Resistive Memory Devices Operated In-situ in a Transmission Electron Microscope by Electron Energy Loss Spectroscopy and Off-Axis Electron Holography
Cooper, David, Bernier, Nicolas, Baumer, Christoph, Dunin-Borkowski, Rafal, Dittmann, ReginaVolume:
22
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927616012289
Date:
November, 2016
File:
PDF, 212 KB
english, 2016