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Temperature dependence of exchange bias in (NiFe/IrMn) n multilayer films studied through static and dynamic techniques
Adams, Daniel J., Khanal, Shankar, Khan, Mohammad Asif, Maksymov, Artur, Spinu, LeonardVolume:
8
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.5006168
Date:
May, 2018
File:
PDF, 4.29 MB
english, 2018