[IEEE 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Hangzhou, China (2016.10.25-2016.10.28)] 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Evolution and revolution of electrostatic discharge (ESD) and electrical overstress (EOS) testing for components and systems
Voldman, Steven H.Year:
2016
Language:
english
DOI:
10.1109/ICSICT.2016.7998945
File:
PDF, 890 KB
english, 2016