Super-Resolution for Biometrics: A Comprehensive Survey

Pattern Recognition 2018 / 1

Nguyen, Kien, Fookes, Clinton, Sridharan, Sridha, Tistarelli, Massimo, Nixon, Mark

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Language:

english

Journal:

Pattern Recognition

DOI:

10.1016/j.patcog.2018.01.002

Date:

January, 2018

File:

PDF, 11.51 MB

english, 2018

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