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[IEEE 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Cambridge, United Kingdom (2017.10.23-2017.10.25)] 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Kernel vulnerability factor and efficient hardening for histogram of oriented gradients
Weigel, Lucas, Fernandes, Fernando, Navaux, Philippe, Rech, PaoloYear:
2017
Language:
english
DOI:
10.1109/DFT.2017.8244439
File:
PDF, 516 KB
english, 2017